• DocumentCode
    707945
  • Title

    Complex delay fault reasoning with sequential 7-valued algebra

  • Author

    Kousaar, Jaak ; Ubar, Raimund ; Aleksejev, Igor

  • Author_Institution
    Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
  • fYear
    2015
  • fDate
    25-27 March 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A method is proposed for simulating of transition delay faults (TDF) at different fault propagation conditions. The main idea of the method is to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions like non-robust and functional sensitization. A new sensitization type, called nonrobust functional sensitization was introduced as well. A novel delay fault reasoning algorithm based on sequential 7-valued algebra is presented, which is used for fault coverage calculation separately for all mentioned four types of TDFs. By experimental results we established that the fault coverage share for different types of TDFs considerably depends on the quality of delay test.
  • Keywords
    algebra; circuit testing; delay circuits; digital arithmetic; digital circuits; logic gates; TDF model; complex delay fault reasoning; delay fault reasoning algorithm; delay test; fault coverage calculation; fault propagation conditions; nonrobust functional sensitization; sensitization type; sequential 7-valued algebra; transition delay faults; Algebra; Circuit faults; Delays; Integrated circuit modeling; Logic gates; Robustness; Solid modeling; 7-valued algebra; critical path fault tracing; non-robust and functional sensitization; transition delay faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (LATS), 2015 16th Latin-American
  • Conference_Location
    Puerto Vallarta
  • Type

    conf

  • DOI
    10.1109/LATW.2015.7102403
  • Filename
    7102403