A method of one-pass seed generation for LFSR-based deterministic/pseudo-random testing of static faults

This paper proposes a method of LFSR seed generation for deterministic and pseudo-random testing of static faults. The proposed method directly generate seeds by using ATPG and avoids unsuccessful encoding of conventional two-pass generation methods. The effectiveness of the proposed method is evaluated through experiments for several LFSRbased pseudo-random pattern generators. The quality of seeds generated by the proposed method is evaluated by stuck-at fault coverage when test patterns are expanded from seeds.