• DocumentCode
    708065
  • Title

    A geometry-independent lifetime modelling method for aluminum heavy wire bond joints

  • Author

    Grams, Arian ; Hofer, Jan ; Middendorf, Andreas ; Schmitz, Stefan ; Wittler, Olaf ; Lang, Klaus-Dieter

  • Author_Institution
    Fraunhofer IZM, Berlin, Germany
  • fYear
    2015
  • fDate
    19-22 April 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Wire bond degradation is a limiting factor for the lifetime of state of the art power modules. So, there is a need for widely applicable and proven modelling techniques to achieve a reliable design. In this paper, a new crack growth law has been developed and calibrated with experimental data. By defining a failure criterion and optimizing model parameters, good lifetime predictions have been achieved. In addition, further possibilities to use this modelling approach have been proposed, e.g. damage in interconnect layers as sinter silver or solder layers could be considered.
  • Keywords
    aluminium alloys; integrated circuit bonding; integrated circuit interconnections; integrated circuit reliability; lead bonding; silver; solders; Ag; Al; aluminum heavy wire bond joints; crack growth law; failure criterion; geometry-independent lifetime modelling method; interconnect layers; lifetime predictions; silver layers; solder layers; wire bond degradation; Insulated gate bipolar transistors; MOSFET; Plastics; Semiconductor device modeling; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4799-9949-1
  • Type

    conf

  • DOI
    10.1109/EuroSimE.2015.7103091
  • Filename
    7103091