DocumentCode
708065
Title
A geometry-independent lifetime modelling method for aluminum heavy wire bond joints
Author
Grams, Arian ; Hofer, Jan ; Middendorf, Andreas ; Schmitz, Stefan ; Wittler, Olaf ; Lang, Klaus-Dieter
Author_Institution
Fraunhofer IZM, Berlin, Germany
fYear
2015
fDate
19-22 April 2015
Firstpage
1
Lastpage
6
Abstract
Wire bond degradation is a limiting factor for the lifetime of state of the art power modules. So, there is a need for widely applicable and proven modelling techniques to achieve a reliable design. In this paper, a new crack growth law has been developed and calibrated with experimental data. By defining a failure criterion and optimizing model parameters, good lifetime predictions have been achieved. In addition, further possibilities to use this modelling approach have been proposed, e.g. damage in interconnect layers as sinter silver or solder layers could be considered.
Keywords
aluminium alloys; integrated circuit bonding; integrated circuit interconnections; integrated circuit reliability; lead bonding; silver; solders; Ag; Al; aluminum heavy wire bond joints; crack growth law; failure criterion; geometry-independent lifetime modelling method; interconnect layers; lifetime predictions; silver layers; solder layers; wire bond degradation; Insulated gate bipolar transistors; MOSFET; Plastics; Semiconductor device modeling; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
Conference_Location
Budapest
Print_ISBN
978-1-4799-9949-1
Type
conf
DOI
10.1109/EuroSimE.2015.7103091
Filename
7103091
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