• DocumentCode
    708290
  • Title

    An optimized layout with low parasitic inductances for GaN HEMTs based DC-DC converter

  • Author

    Wang Kangping ; Ma Huan ; Li Hongchang ; Guo Yixuan ; Yang Xu ; Zeng Xiangjun ; Yu Xiaoling

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´an Xiaotong Univ., Xi´an, China
  • fYear
    2015
  • fDate
    15-19 March 2015
  • Firstpage
    948
  • Lastpage
    951
  • Abstract
    Reducing parasitic inductances are critical for improving efficiency and safety in Gallium Nitride (GaN) based DC-DC Converter. This paper aims at reducing the driver loop inductance and power loop inductance by optimizing the PCB layout. Firstly, this paper compares three different kinds of driver loop layouts by Maxwell 3D simulation. The results show that the driver loop inductances of single-layer layout with a shielding layer and double-layers layout are much smaller than that of the conventional single-layer layout. Then a novel doublesided layout is proposed, which has a small power loop inductance because the magnetic field is significantly canceled by the interleaved current. Finally, the design is verified by a buck converter operating at an input voltage of 12 V, an output voltage of 3.3 V, and an output current of 8 A. Experimental results show that the power loop inductance is about 0.1nH, which reduces 75% than that of the reported best layout.
  • Keywords
    DC-DC power convertors; circuit simulation; gallium compounds; inductance; printed circuit layout; DC-DC converter; GaN; HEMT; Maxwell 3D simulation; PCB layout; buck converter; current 8 A; double-layers layout; driver loop inductance; gallium nitride; optimized layout; power loop inductance; shielding layer; single-layer layout; voltage 12 V; voltage 3.3 V; Gallium nitride; HEMTs; Inductance; Layout; Logic gates; Switches; Voltage control; DC-DC Converter; Gallium Nitride; layout; parasitic inductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
  • Conference_Location
    Charlotte, NC
  • Type

    conf

  • DOI
    10.1109/APEC.2015.7104463
  • Filename
    7104463