• DocumentCode
    708602
  • Title

    Geometric G1-Renewal process as repairable system model

  • Author

    Kaminskiy, Mark ; Krivtsov, Vasiliy

  • Author_Institution
    NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • fYear
    2015
  • fDate
    26-29 Jan. 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper considers a point process model with a monotonically decreasing or increasing ROCOF and the underlying distributions from the location-scale family, known as the geometric process [8]. In terms of repairable system reliability analysis, the process is capable of modeling various restoration types including “better-than-new”, i.e., the one not covered by the popular G-Renewal model [7]. The distinctive property of the process is that the times between successive events are obtained from the underlying distributions as the scale parameter of each is monotonically decreasing or increasing. The paper discusses properties and maximum likelihood estimation of the model for the case of the Exponential and Weibull underlying distributions.
  • Keywords
    Weibull distribution; exponential distribution; maintenance engineering; maximum likelihood estimation; reliability; ROCOF; Weibull distribution; exponential distribution; geometric G1-renewal process; maximum likelihood estimation; repairable system model; repairable system reliability analysis; restoration; Exponential distribution; Hazards; Maintenance engineering; Mathematical model; Maximum likelihood estimation; Reliability; Weibull distribution; aging; g-renewal; geometric process; homogeneity; non-homogeneity; rejuvenation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2015 Annual
  • Conference_Location
    Palm Harbor, FL
  • Print_ISBN
    978-1-4799-6702-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2015.7105174
  • Filename
    7105174