DocumentCode
708602
Title
Geometric G1-Renewal process as repairable system model
Author
Kaminskiy, Mark ; Krivtsov, Vasiliy
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
2015
fDate
26-29 Jan. 2015
Firstpage
1
Lastpage
6
Abstract
This paper considers a point process model with a monotonically decreasing or increasing ROCOF and the underlying distributions from the location-scale family, known as the geometric process [8]. In terms of repairable system reliability analysis, the process is capable of modeling various restoration types including “better-than-new”, i.e., the one not covered by the popular G-Renewal model [7]. The distinctive property of the process is that the times between successive events are obtained from the underlying distributions as the scale parameter of each is monotonically decreasing or increasing. The paper discusses properties and maximum likelihood estimation of the model for the case of the Exponential and Weibull underlying distributions.
Keywords
Weibull distribution; exponential distribution; maintenance engineering; maximum likelihood estimation; reliability; ROCOF; Weibull distribution; exponential distribution; geometric G1-renewal process; maximum likelihood estimation; repairable system model; repairable system reliability analysis; restoration; Exponential distribution; Hazards; Maintenance engineering; Mathematical model; Maximum likelihood estimation; Reliability; Weibull distribution; aging; g-renewal; geometric process; homogeneity; non-homogeneity; rejuvenation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2015 Annual
Conference_Location
Palm Harbor, FL
Print_ISBN
978-1-4799-6702-5
Type
conf
DOI
10.1109/RAMS.2015.7105174
Filename
7105174
Link To Document