Title :
2D imaging system with optical tracking for EMI source localization
Author :
Hui He ; Khilkevich, Victor ; Pommerenke, David
Author_Institution :
Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
This research presents a 2D imaging system with optical tracking to localize radiating sources. Optical tracking system is used for localizing the position of the near field measurement probe. Emission source microscopy (ESM) algorithm derived from synthetic aperture radar (SAR) technique is used to localize radiating sources.
Keywords :
electric noise measurement; electromagnetic interference; infrared imaging; optical tracking; 2D imaging system; EMI source localization; emission source microscopy algorithm; near field measurement probe; optical tracking system; radiating source localization; synthetic aperture radar technique; Antenna measurements; Electromagnetic interference; Image reconstruction; Optical imaging; Optical reflection; Synthetic aperture radar; Transmission line measurements; EMI; ESM; SAR; near-field scanning; optical tracking; source localization;
Conference_Titel :
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-1992-5
DOI :
10.1109/EMCSI.2015.7107668
