• DocumentCode
    709117
  • Title

    Detection of very small impurity particles in high-quality granulated sugar

  • Author

    Albers, Tobias ; Peichl, Markus ; Dill, Stephan

  • Author_Institution
    Microwaves & Radar Inst, DLR (German Aerosp. Center) Oberpfaffenhofen, Wessling, Germany
  • fYear
    2015
  • fDate
    16-18 March 2015
  • Firstpage
    315
  • Lastpage
    318
  • Abstract
    This paper is about first fundamental investigations whether radar technology can detect smallest impurities in the production of high-quality granulated sugar. Based on some theoretical considerations the sensitivity of microwave interaction with some reference targets and some typical impurity particles is explored using a measurement setup at predominantly W band (75 - 110 GHz). In dependence of various adjustable parameters like bi-static angle, polarization, and frequency band a selection of suitable measurement configurations is finally discussed. The goal is to detect smallest impurities primarily inside and of course as well on the surface of a sugar heap.
  • Keywords
    impurities; product quality; radar applications; sugar; W band; bistatic angle; frequency 75 GHz to 110 GHz; frequency band; high-quality granulated sugar production; measurement configuration selection; measurement setup; microwave interaction; polarization; radar technology; sugar heap surface; very small particle detection; Frequency measurement; Impurities; Metals; Microwave measurement; Permittivity; Radar; Sugar; Bi-static radar; W band; food monitoring; impurities; incidence angle; polarization; relative permittivity; sugar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (GeMiC), 2015 German
  • Conference_Location
    Nuremberg
  • Type

    conf

  • DOI
    10.1109/GEMIC.2015.7107817
  • Filename
    7107817