DocumentCode
709598
Title
Vacuum ultraviolet (VUV) and vapor-combined surface modification for hybrid bonding at low temperature and atmospheric pressure
Author
Shigetou, Akitsu ; Mizuno, Jun ; Shoji, Shuichi
Author_Institution
Nat. Inst. for Mater. Sci., Tsukuba, Japan
fYear
2015
fDate
14-17 April 2015
Firstpage
239
Lastpage
242
Abstract
High feasibility of the vacuum ultraviolet (VUV) and vapor - combined surface modification method was demonstrated at the temperatures lower than 200 °C and atmospheric pressure, for the power/green electronic materials such as SiC (Si-related semiconductors), and GaN. Hybrid bonding of these materials will be of practical use in obtaining high reliability and performance in thin power devices. The water vapor, which was included in VUV irradiation atmosphere (N2) at the tuned amount of exposure ((g/m3)·s), helped generate hydrogen and hydroxyl radicals, then resulted in the elimination of surface contaminant, partial deoxidization of native oxide, and the formation of hydrate bridging layers at the same time. According to the change in the generation ratio of bridging layers, the exposure of 3 - 4 × 103 (g/m3)·s was chosen as a possible process window. Upon heating at 150 - 200 °C, the hydrogen bonds, which were followed by the dehydration inside the bridging layers, formed tight adhesion between the surfaces. Although the bond area was limited due to the partial contact at the touchdown, the interface did not contain readily visible voids.
Keywords
atmospheric pressure; bonding processes; power electronics; reliability; vacuum techniques; VUV irradiation atmosphere; atmospheric pressure; bridging layer generation ratio; dehydration; high reliability; hybrid bonding; hydrogen radicals; hydroxyl radicals; partial contact; partial deoxidization; power-green electronic materials; surface contaminant elimination; temperature 150 degC to 200 degC; thin power devices; vacuum ultraviolet modification; vapor-combined surface modification method; water vapor; Bonding; Gallium nitride; Radiation effects; Silicon carbide; Surface cleaning; Surface contamination; GaN; SiC; atmospheric pressure; hybrid bonding; low temperature; vacuum ultraviolet (VUV);
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on
Conference_Location
Kyoto
Print_ISBN
978-4-9040-9012-1
Type
conf
DOI
10.1109/ICEP-IAAC.2015.7111030
Filename
7111030
Link To Document