• DocumentCode
    709608
  • Title

    Measurement of surface roughness dependence of thermal contact resistance under low pressure condition

  • Author

    Azuma, Kuniya ; Hatakeyama, Tomoyuki ; Nakagawa, Shinji

  • Author_Institution
    Dept. of Mech. Syst. Eng., Toyama Prefectural Univ., Kurokawa, Japan
  • fYear
    2015
  • fDate
    14-17 April 2015
  • Firstpage
    381
  • Lastpage
    384
  • Abstract
    Recently, thermal design of electrical equipment is important. Thermal contact resistance is one of the important parameters in the thermal design. However, thermal contact resistance is dependent on various factors, for example surface roughness, the contact pressure and the hardness of the material. Therefore, quantitative evaluation is difficult, and a little information can be obtained under high pressure conditions. In this study, we examine surface roughness and material hardness dependence of thermal contact resistance under low pressure condition. The materials to be measured are Al1070 and S45C, and three patterns (Ra = 0.2, 3.2, 12.5) of surface roughness are examined. Range of the contact pressure is 7.8 - 78 kPa. And, we have investigated the thermal resistance changed by contact pressure. From the experimental results, the reduction rate of the thermal contact resistance by increasing in pressure is dependent on the surface roughness, and thermal resistance of low hardness sample is saturated at higher contact pressure. Further, we discuss the relationship between the contact pressure and thermal resistance by the “Hertzian contact theory”. As a result, we confirm that the experimental results can be approximated by this equation.
  • Keywords
    contact resistance; surface roughness; surface topography measurement; thermal resistance; Al1070; Hertzian contact theory; S45C; contact pressure; electrical equipment; material hardness dependence; pressure 7.8 kPa to 78 kPa; surface roughness measurement; thermal contact resistance; Contact resistance; Electrical resistance measurement; Rough surfaces; Surface resistance; Surface roughness; Thermal resistance; Hertzian contact theory; surface roughness; thermal contact resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-9040-9012-1
  • Type

    conf

  • DOI
    10.1109/ICEP-IAAC.2015.7111040
  • Filename
    7111040