• DocumentCode
    710371
  • Title

    Trinocular adaptive window size disparity estimation algorithm and its real-time hardware

  • Author

    Akin, Abdulkadir ; Capoccia, Raffaele ; Narinx, Jonathan ; Baz, Ipek ; Schmid, Alexandre ; Leblebici, Yusuf

  • Author_Institution
    Microelectron. Syst. Lab. (LSM), Ecole Polytech. Fed. de Lausanne (EPFL) Lausanne, Lausanne, Switzerland
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper proposes a hardware-oriented trinocular adaptive window size disparity estimation (T-AWDE) algorithm and the first real-time trinocular disparity estimation (DE) hardware that targets high-resolution images with high-quality disparity results. The proposed trinocular DE hardware is the enhanced version of the recently published binocular AWDE implementation. The T-AWDE hardware generates a very high-quality depth map by merging two depth maps obtained from the center-left and center-right camera pairs. The T-AWDE hardware enhances disparity results by applying a double checking scheme which solves most of the occlusion problems existing in the AWDE implementation while providing correct disparity results even for objects located at left or right edge of the center image. The proposed T-AWDE hardware architecture enables handling 55 frames per second on a Virtex-7 FPGA at a 1024×768 XGA video resolution for a 128 pixels disparity range.
  • Keywords
    estimation theory; field programmable gate arrays; image resolution; real-time systems; DE hardware; T-AWDE algorithm; Virtex-7 FPGA; XGA video resolution; hardware oriented trinocular adaptive window size disparity estimation; image resolution; real-time hardware; real-time trinocular disparity estimation; trinocular DE hardware; trinocular adaptive window size disparity estimation algorithm; Cameras; Computer architecture; Estimation; Field programmable gate arrays; Hardware; Real-time systems; Streaming media; FPGA; Hardware Architecture; Real-Time; Trinocular Disparity Estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2015.7114525
  • Filename
    7114525