• DocumentCode
    710378
  • Title

    A 1 Mb/s–40 Mb/s human body channel communication transceiver

  • Author

    Ching-Che Chung ; Chi-Tung Chang ; Chih-Yu Lin

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A high data rate, low-power, and large random jitter tolerance wideband signaling (WBS) transceiver for human body channel communication (BCC) is presented in this paper. Firstly, an investigation of human body channel characteristics from 1MHz to 80MHz is discussed. Then in the transmitter part, the proposed WBS transceiver uses a NRZI encoding scheme to transmit data. At the receiver part, a blind 7X oversampling clock and data recovery (CDR) circuit with the vote mechanism can effectively recover the data which distorted by the frequency drift and random noise from body antenna effects. The proposed WBS transceiver is implemented in a standard performance 90nm CMOS process, and the core area is 0.04 mm2. The supported data rate of the proposed WBS transceiver ranges from 1Mb/s to 40Mb/s. The power consumption is 1.94mW at 40Mb/s, and the bit energy is 0.0485 nJ/b.
  • Keywords
    CMOS integrated circuits; HF antennas; VHF antennas; biomedical communication; broadband antennas; clock and data recovery circuits; jitter; radio transceivers; random noise; telecommunication signalling; wearable antennas; wireless channels; BCC; CDR circuit; CMOS process; NRZI encoding scheme; WBS transceiver; bit rate 1 Mbit/s to 4 Mbit/s; blind 7X oversampling clock and data recovery circuit; body antenna effect; frequency drift; human body channel communication transceiver; power consumption; random jitter tolerance wideband signaling transceiver; random noise; size 90 nm; vote mechanism; Clocks; Frequency shift keying; Frequency-domain analysis; Jitter; Transceivers; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2015.7114536
  • Filename
    7114536