• DocumentCode
    710394
  • Title

    Prospect of embedded non-volatile memory in the smart society

  • Author

    Yamauchi, Tadaaki

  • Author_Institution
    Renesas Electron. Corp., Tokyo, Japan
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Embedded Flash (eFlash) is widely accepted by various applications because of reducing overall costs of system development, production and inventory. Continuous evolution of eFlash such as the split-gate charge-trapping memory has satisfied the most stringent quality requirement for automotive applications. Smart society for offering a better quality of life would diversify NV memory until the establishment of emerging memories. Add-on type eFlash with a few additional masks would replace the stand-alone data flash for adaptive tuning and security over the network. Towards the possible convergence of NV-memory in smart society, emerging memories such as ReRAM and STT-MRAM are progressing. Excellent features of smaller rewrite energy with the extending rewrite cycles could contribute to the outstanding energy saving such as normally-off systems.
  • Keywords
    flash memories; masks; random-access storage; NV memory; ReRAM; STT-MRAM; adaptive tuning; add-on type eFlash; automotive application; cost reduction; data flash; embedded flash; embedded nonvolatile memory; mask; normally-off system; security; smart society; split-gate charge-trapping memory; Automotive engineering; Consumer electronics; Memory management; Nonvolatile memory; Reliability; Safety; Security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2015.7114556
  • Filename
    7114556