DocumentCode :
710402
Title :
Automated design space exploration of transient fault detectable datapath based on user specified power and delay constraints
Author :
Sengupta, Anirban ; Bhadauria, Saumya
Author_Institution :
Comput. Sci. & Eng., Indian Inst. of Technol., Indore, Indore, India
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
4
Abstract :
A novel automated design space exploration (DSE) approach of multi-cycle transient fault detectable datapath based on multi-objective user constraints (power and delay) during high level synthesis (HLS) is presented in this paper. To the best of the authors´ knowledge, this is the first work in the literature to solve this problem. The presented approach, driven by bacterial foraging optimization (BFO) algorithm provides easy flexibility to change direction in the design space through tumble/swim actions if a search path is found ineffective. The approach is highly capable of reaching true Pareto optimal region indicated by the closeness of our non-dominated solutions to the true Pareto front and their uniform spreading over the Pareto curve (implying diversity). The contributions of this paper are as follows: a) novel exploration approach for generating high quality transient fault detectable structure based on user provided requirements of power-delay, which is capable of transient error detection; b) novel fault detectable algorithm for handling single and multi-cycle transient faults. The results of the proposed approach indicated an average improvement in Quality of Results (QoR) of >9% and reduction in hardware usage of > 26 % compared to recent approaches that are closer in solving a similar objective.
Keywords :
Pareto optimisation; circuit optimisation; fault diagnosis; high level synthesis; integrated circuit design; transient analysis; BFO algorithm; DSE approach; HLS; Pareto curve; automated design space exploration approach; bacterial foraging optimization algorithm; delay constraints; high level synthesis; high quality transient fault detectable structure generation; multicyle transient fault detectable datapath; multiobjective user constraints; transient error detection; true Pareto optimal region; user specified power constraints; Algorithm design and analysis; Delays; Fault detection; Fault diagnosis; Hardware; Microorganisms; Transient analysis; HLS; bacterium; delay; exploration; multi cycle; power; transient fault detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
Conference_Location :
Hsinchu
Type :
conf
DOI :
10.1109/VLSI-DAT.2015.7114570
Filename :
7114570
Link To Document :
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