DocumentCode :
710651
Title :
Test compaction by test cube merging for four-way bridging faults
Author :
Pomeranz, Irith
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
6
Abstract :
Test compaction that accommodates the constraints of test data compression can be achieved by generating test cubes for target faults, and then merging the test cubes. This paper describes an improved test cube merging procedure for four-way bridging faults. The procedure is motivated by the prevalence of bridging defects and the fact that test sets for bridging faults are larger than test sets for single stuck-at faults. A four-way bridging fault gi/ai/hi models the case where a value ai of a line hi dominates the value of a line gi. A basic test cube merging procedure considers a set of test cubes Cdet that detects target faults. The paper extends the set of test cubes to include, in addition to Cdet, a set of test cubes Cdom that assign values to dominating lines. Test cubes from Cdom have significantly fewer specified values than test cubes from Cdet. When test cubes from Cdom are merged with test cubes from Cdet, each resulting test cube detects more faults, and fewer test cubes are needed for detecting the same set of target faults.
Keywords :
data compression; fault diagnosis; logic testing; bridging defects; four-way bridging faults; stuck-at faults; test compaction; test cube merging procedure; test data compression; Benchmark testing; Circuit faults; Compaction; Indexes; Integrated circuit modeling; Merging; Test data compression; Bridging faults; static test compaction; test cubes; test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location :
Napa, CA
Type :
conf
DOI :
10.1109/VTS.2015.7116298
Filename :
7116298
Link To Document :
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