DocumentCode
711136
Title
Improving aerospace electronics by systemic early failure analysis during development and modification
Author
Verbitsky, David E.
Author_Institution
Alefa-EEQRA, Edison, NJ, USA
fYear
2015
fDate
7-14 March 2015
Firstpage
1
Lastpage
15
Abstract
A three-stage systemic early failure analysis (SEFA) methodology is proposed. It addresses prevalent failures occurring during development using diverse experimental and theoretical techniques and structures. SEFA provides a flexible yet consistent effective and efficient approach leading to a rare combination of unified high quality, reliability, safety, improvement and profitability (QIP). The SEFA impact is maximized when a proper process is implemented at hi-tech mass-produced demanding electronics business. Practical and specific SEFA techniques, classifications and examples substantiate and illustrate the proposed approach.
Keywords
air safety; avionics; failure analysis; reliability; SEFA; aerospace electronics improvement; hi-tech mass produced demanding electronics business; reliability; safety; systemic early failure analysis; Materials reliability; Metrology; Process control; Qualifications; Quality function deployment;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2015 IEEE
Conference_Location
Big Sky, MT
Print_ISBN
978-1-4799-5379-0
Type
conf
DOI
10.1109/AERO.2015.7118892
Filename
7118892
Link To Document