• DocumentCode
    711136
  • Title

    Improving aerospace electronics by systemic early failure analysis during development and modification

  • Author

    Verbitsky, David E.

  • Author_Institution
    Alefa-EEQRA, Edison, NJ, USA
  • fYear
    2015
  • fDate
    7-14 March 2015
  • Firstpage
    1
  • Lastpage
    15
  • Abstract
    A three-stage systemic early failure analysis (SEFA) methodology is proposed. It addresses prevalent failures occurring during development using diverse experimental and theoretical techniques and structures. SEFA provides a flexible yet consistent effective and efficient approach leading to a rare combination of unified high quality, reliability, safety, improvement and profitability (QIP). The SEFA impact is maximized when a proper process is implemented at hi-tech mass-produced demanding electronics business. Practical and specific SEFA techniques, classifications and examples substantiate and illustrate the proposed approach.
  • Keywords
    air safety; avionics; failure analysis; reliability; SEFA; aerospace electronics improvement; hi-tech mass produced demanding electronics business; reliability; safety; systemic early failure analysis; Materials reliability; Metrology; Process control; Qualifications; Quality function deployment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2015 IEEE
  • Conference_Location
    Big Sky, MT
  • Print_ISBN
    978-1-4799-5379-0
  • Type

    conf

  • DOI
    10.1109/AERO.2015.7118892
  • Filename
    7118892