• DocumentCode
    712855
  • Title

    Theoretical limits of superjunction considering with charge imbalance margin

  • Author

    Saito, Wataru

  • Author_Institution
    Toshiba Corp. Semicond. & Storage Products Co., Tokyo, Japan
  • fYear
    2015
  • fDate
    10-14 May 2015
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    This paper reports that the theoretical limit of the superjunction (SJ) structure is discussed with considering the charge imbalance margin. The SJ structure is attractive to reduce the specific on-resistance dramatically due to the charge compensation concept. The breakdown voltage, however, is lowered by the charge imbalance between n- and p-columns due to the electric field modulation. The analytical models of the theoretical on-resistance limit considered with the charge imbalance margin were provided in this work. The analytical results showed that the on-resistance reduction required not only lateral pitch narrowing but also the charge imbalance margin cut. This tendency can be confirmed from the experimental results in the previous works. The theoretical limit was estimated to be 7 mΩcm2 for 600 V-class SJ-MOS with the charge imbalance margin of 3%.
  • Keywords
    power MOSFET; semiconductor device breakdown; semiconductor doping; semiconductor junctions; SJ-MOS; breakdown voltage; charge compensation; charge imbalance margin; electric field modulation; on-resistance reduction; superjunction structure limit; superjunction theoretical limits; theoretical on-resistance limit; voltage 600 V; Analytical models; Doping profiles; Electric fields; Junctions; MOSFET; Modulation; analytical model; on-resistance limit; superjunction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
  • Conference_Location
    Hong Kong
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-6259-4
  • Type

    conf

  • DOI
    10.1109/ISPSD.2015.7123405
  • Filename
    7123405