DocumentCode
713489
Title
Effect of DNA length on dielectrophoretic characteristics of DNA-labeled microbeads
Author
Kasahara, Hiromichi ; Zhenhao Ding ; Nakano, Michihiko ; Suehiro, Junya
Author_Institution
Grad. Sch. of Inf. Sci. & Electr. Eng., Kyushu Univ., Fukuoka, Japan
fYear
2015
fDate
17-19 March 2015
Firstpage
3341
Lastpage
3346
Abstract
Polymerase chain reaction (PCR) is a powerful tool for diagnostic procedures in bacterial and viral infections. We have developed a new electrical technique for rapid detection of DNA amplified by PCR using dielectrophoresis (DEP) of microbeads that are chemically labeled with the amplicons. The DNA immobilization on the microbeads alters their DEP behavior in such a way that they are trapped on a microelectrode under the action of positive DEP, whereas pristine microbeads are not. Combining the dramatic alteration in DEP characteristics with impedance measurement leads to rapid and quantitative detection of amplicons. The method is based on the surface conductivity dependence of microbeads DEP characteristics. It was expected that the surface conductivity would depend on the length of DNA fragments immobilized on a microbeads. In this study, it was found that the crossover frequency was dependent on the length of DNA.
Keywords
DNA; bioMEMS; bioelectric potentials; biosensors; electric impedance measurement; electrophoresis; enzymes; microelectrodes; microsensors; molecular biophysics; molecular configurations; surface conductivity; DEP behavior; DNA fragments; DNA immobilization; DNA length effect; DNA-labeled microbeads; PCR; amplicons; bacterial infections; crossover frequency; diagnostic procedures; dielectrophoretic characteristics; electrical technique; impedance measurement; microelectrode; polymerase chain reaction; pristine microbeads; surface conductivity; viral infections; Conductivity; DNA; Dielectrophoresis; Electric fields; Force; Microelectrodes; DNA detection; dielectrophoresis; polemerase chain reaction; surface conductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Technology (ICIT), 2015 IEEE International Conference on
Conference_Location
Seville
Type
conf
DOI
10.1109/ICIT.2015.7125593
Filename
7125593
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