DocumentCode
713600
Title
Online self adjusting progressive age monitoring of timing variations
Author
Sadeghi-Kohan, Somayeh ; Kamal, Mehdi ; McNeil, John ; Prinetto, Paolo ; Navabi, Zain
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear
2015
fDate
21-23 April 2015
Firstpage
1
Lastpage
2
Abstract
Transistor and interconnect wearout is accelerated with transistor scaling that results in timing variations. Progressive age measurement of a circuit can help a better prevention mechanism for reducing more aging. This requires age monitors that collect progressive age information of the circuit. This paper focuses on monitor structures for implementation of progressive age detection. The monitors are self-adjusting that they adjust themselves to detect progressive changes in the timing of a circuit. Furthermore, the monitors are designed for low hardware overhead, and certainty in reported timing changes.
Keywords
ageing; semiconductor device reliability; transistors; circuit timing; hardware overhead; interconnect wearout; online self adjusting progressive age monitoring; progressive age detection; progressive age measurement; timing variations; transistor scaling; transistor wearout; Aging; Clocks; Monitoring; Program processors; Temperature measurement; Temperature sensors; Timing; aging phenomena; phase-shift clock; self-adjusting monitors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on
Conference_Location
Naples
Type
conf
DOI
10.1109/DTIS.2015.7127368
Filename
7127368
Link To Document