• DocumentCode
    713600
  • Title

    Online self adjusting progressive age monitoring of timing variations

  • Author

    Sadeghi-Kohan, Somayeh ; Kamal, Mehdi ; McNeil, John ; Prinetto, Paolo ; Navabi, Zain

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2015
  • fDate
    21-23 April 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Transistor and interconnect wearout is accelerated with transistor scaling that results in timing variations. Progressive age measurement of a circuit can help a better prevention mechanism for reducing more aging. This requires age monitors that collect progressive age information of the circuit. This paper focuses on monitor structures for implementation of progressive age detection. The monitors are self-adjusting that they adjust themselves to detect progressive changes in the timing of a circuit. Furthermore, the monitors are designed for low hardware overhead, and certainty in reported timing changes.
  • Keywords
    ageing; semiconductor device reliability; transistors; circuit timing; hardware overhead; interconnect wearout; online self adjusting progressive age monitoring; progressive age detection; progressive age measurement; timing variations; transistor scaling; transistor wearout; Aging; Clocks; Monitoring; Program processors; Temperature measurement; Temperature sensors; Timing; aging phenomena; phase-shift clock; self-adjusting monitors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on
  • Conference_Location
    Naples
  • Type

    conf

  • DOI
    10.1109/DTIS.2015.7127368
  • Filename
    7127368