Title :
Silicon CMOS compatible in situ CCVD growth of graphene on silicon nitride
Author :
Noll, D. ; Schwalke, U.
Author_Institution :
Inst. for Semicond. Technol. & Nanoelectron., Tech. Univ. Darmstadt, Darmstadt, Germany
Abstract :
In this paper we report on the possibility of the silicon CMOS compatible fabrication of graphene field effect transistors on a silicon nitride high-k dielectric. For this purpose the catalytic chemical vapor deposition, which has already been approved to work on SiO2 surfaces [1], is used to grow graphene. First electrical results indicate a bilayer graphene with an on/off current ratio of 103 to 104, which can be achieved with lower threshold voltages. A greater on/off current ratio may be possible, as the off current is degraded through gate leakage current.
Keywords :
CMOS integrated circuits; chemical vapour deposition; elemental semiconductors; field effect transistors; graphene devices; high-k dielectric thin films; semiconductor growth; silicon; silicon compounds; SiN; bilayer graphene; catalytic chemical vapor deposition; gate leakage current; graphene field effect transistors; in situ CCVD growth; on-off current ratio; silicon CMOS compatible fabrication; silicon dioxide surfaces; silicon nitride high-k dielectric; threshold voltage; Dielectrics; Graphene; High K dielectric materials; Metals; Silicon; Substrates; Transistors;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on
Conference_Location :
Naples
DOI :
10.1109/DTIS.2015.7127387