DocumentCode
714176
Title
Contourlet domain image denoising based on the Bessel k-form distribution
Author
Sadreazami, H. ; Ahmad, M. Omair ; Swamy, M.N.S.
Author_Institution
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
fYear
2015
fDate
3-6 May 2015
Firstpage
1234
Lastpage
1237
Abstract
Statistical image modeling has attracted great attention in the field of image denoising. In this work, a new image denoising method in the contourlet domain is introduced in which the contourlet coefficients of images are modeled by using the Bessel k-form prior. A noisy image is decomposed into a low frequency approximation sub-image and a series of high frequency detail sub-images at different scales and directions via the contourlet transform. To estimate the noise-free coefficients in detail subbands, a Bayesian estimator is developed utilizing the Bessel k-form distribution. In order to estimate the parameters of the distribution, a characteristic function-based technique is used. Simulation results on standard test images show improved performance both in visual quality and in terms of the peak signal-to-noise ratio and structural similarity index as compared to some of the existing denoising methods. The proposed method also achieves an excellent balance between noise suppression and details preservation.
Keywords
Bayes methods; approximation theory; image denoising; parameter estimation; statistical distributions; transforms; Bayesian estimator; Bessel k-form distribution; characteristic function-based technique; contourlet coefficients; contourlet domain image denoising; low frequency approximation subimage; noise suppression; noise-free coefficients; noisy image decomposition; parameter estimation; peak signal-to-noise ratio; statistical image modeling; structural similarity index; visual quality; Bayes methods; Image denoising; Noise; Noise measurement; Noise reduction; Probability density function; Transforms; Bayesian estimator; Bessel k-form distribution; Image denoising; contourlet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering (CCECE), 2015 IEEE 28th Canadian Conference on
Conference_Location
Halifax, NS
ISSN
0840-7789
Print_ISBN
978-1-4799-5827-6
Type
conf
DOI
10.1109/CCECE.2015.7129454
Filename
7129454
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