• DocumentCode
    714176
  • Title

    Contourlet domain image denoising based on the Bessel k-form distribution

  • Author

    Sadreazami, H. ; Ahmad, M. Omair ; Swamy, M.N.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
  • fYear
    2015
  • fDate
    3-6 May 2015
  • Firstpage
    1234
  • Lastpage
    1237
  • Abstract
    Statistical image modeling has attracted great attention in the field of image denoising. In this work, a new image denoising method in the contourlet domain is introduced in which the contourlet coefficients of images are modeled by using the Bessel k-form prior. A noisy image is decomposed into a low frequency approximation sub-image and a series of high frequency detail sub-images at different scales and directions via the contourlet transform. To estimate the noise-free coefficients in detail subbands, a Bayesian estimator is developed utilizing the Bessel k-form distribution. In order to estimate the parameters of the distribution, a characteristic function-based technique is used. Simulation results on standard test images show improved performance both in visual quality and in terms of the peak signal-to-noise ratio and structural similarity index as compared to some of the existing denoising methods. The proposed method also achieves an excellent balance between noise suppression and details preservation.
  • Keywords
    Bayes methods; approximation theory; image denoising; parameter estimation; statistical distributions; transforms; Bayesian estimator; Bessel k-form distribution; characteristic function-based technique; contourlet coefficients; contourlet domain image denoising; low frequency approximation subimage; noise suppression; noise-free coefficients; noisy image decomposition; parameter estimation; peak signal-to-noise ratio; statistical image modeling; structural similarity index; visual quality; Bayes methods; Image denoising; Noise; Noise measurement; Noise reduction; Probability density function; Transforms; Bayesian estimator; Bessel k-form distribution; Image denoising; contourlet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering (CCECE), 2015 IEEE 28th Canadian Conference on
  • Conference_Location
    Halifax, NS
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4799-5827-6
  • Type

    conf

  • DOI
    10.1109/CCECE.2015.7129454
  • Filename
    7129454