• DocumentCode
    714190
  • Title

    Bit error probability performance bounds of CPFSK over fading channels

  • Author

    Hamed, Abdulbaset M. ; Alsharef, Mohammad ; Rao, Raveendra K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, ON, Canada
  • fYear
    2015
  • fDate
    3-6 May 2015
  • Firstpage
    1329
  • Lastpage
    1334
  • Abstract
    Closed-form bit error probability performance bounds for Continuous Phase Frequency Shift Keying (CPFSK) signalling over Rayleigh, Nakagami-m and Generalized-K (KG) fading channels are derived. These bounds are illustrated as a function of energy per bit to noise ratio, Eb/No, channel fading parameters, observation length, n, of the receiver, and modulation index, h. Multiple-bit-observation receiver that is the optimum at high values of Signal-to-Noise Ratio (SNR) is assumed for detection of CPFSK signals in Additive White Gaussian Noise (AWGN). The impact of fading and shadowing on the performance of this receiver is examined in terms of power penalty required to achieve target bit error probability, and as a function of fading parameters c and m.
  • Keywords
    AWGN; Nakagami channels; Rayleigh channels; continuous phase modulation; error statistics; frequency shift keying; signal detection; AWGN; CPFSK signal detection; CPFSK signalling; Nakagami-m fading channels; Rayleigh fading channels; SNR; additive white Gaussian noise; closed-form bit error probability performance bounds; continuous phase frequency shift keying signalling; fading parameter function; generalized-K fading channels; modulation index; multiple-bit-observation receiver; observation length; power penalty; shadowing; signal-to-noise ratio; target bit error probability; Bit error rate; Error probability; Rayleigh channels; Receivers; Shadow mapping; Signal to noise ratio; Average bit error probability; CPFSK; KG channel; Nakagami-m; Rayleigh;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering (CCECE), 2015 IEEE 28th Canadian Conference on
  • Conference_Location
    Halifax, NS
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4799-5827-6
  • Type

    conf

  • DOI
    10.1109/CCECE.2015.7129471
  • Filename
    7129471