• DocumentCode
    71504
  • Title

    Reliability Concerns Related With the Usage of Inorganic Particles in White Light-Emitting Diodes

  • Author

    Lilin Liu ; Xizhao Tan ; Yizhou Li ; Mingyang Wu ; Dongdong Teng ; Gang Wang

  • Author_Institution
    Sch. of Phys. & Eng., Sun Yat-sen Univ., Guangzhou, China
  • Volume
    14
  • Issue
    4
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    968
  • Lastpage
    971
  • Abstract
    Although adding nonemitting inorganic particles to the silicone encapsulant can be a strategy to improve reliabilities of white light-emitting diodes (wLEDs), its validity depends on the inorganic/organic interface compatibility. This work employs ZnO nanoparticles (NPs) with different surface conditions to study the physical relationships between degradation of wLEDs and inorganic/organic interfaces. Experimentally, it is found that 1 wt% of ZnO@SiO2 NPs in lens can slow down the degradation rate of wLEDs under both UV exposure conditions and pressure cooking test conditions.
  • Keywords
    II-VI semiconductors; light emitting diodes; reliability; silicon compounds; silicones; wide band gap semiconductors; zinc compounds; UV exposure conditions; ZnO-SiO2; inorganic-organic interface compatibility; lens; nonemitting inorganic particles; pressure cooking test conditions; reliability concerns; silicone encapsulant; wLED degradation rate; white light-emitting diodes; Aging; Degradation; Educational institutions; Lenses; Light emitting diodes; Materials; Zinc oxide; Inorganic nanoparticle; UV exposure; pressure cooking test; reliability; white light-emitting diode (wLED);
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2014.2358256
  • Filename
    6899620