• DocumentCode
    715917
  • Title

    A soft-error tolerant TCAM using partial don´t-care keys

  • Author

    Syafalni, Infall ; Sasao, Tsutomu ; Xiaoqing Wen ; Holst, Stefan ; Miyase, Kohei

  • fYear
    2015
  • fDate
    25-29 May 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This paper proposes a novel soft-error tolerant TCAM using partial don´t-care keys (X-keys), namely TX, which significantly enhances the tolerance of the TCAM against soft errors. Experimental results show that the soft-error tolerance of the TX outperforms existing schemes. Moreover, the overhead of the TX is very small.
  • Keywords
    content-addressable storage; radiation hardening (electronics); TX overhead; X-keys; partial don´t-care keys; soft-error tolerant TCAM; ternary content addressable memory; Associative memory; Electronic mail; Europe; Indexes; Random access memory; Standards; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2015 20th IEEE European
  • Conference_Location
    Cluj-Napoca
  • Type

    conf

  • DOI
    10.1109/ETS.2015.7138743
  • Filename
    7138743
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=715917