Is adaptive testing the panacea for the future test problems?

With the development of silicon technology and safety-critical applications, the test community is facing many new challenges. In particular, there are many emerging test problems associated with the ever-increasing process variation in the silicon manufacturing process. Adaptive testing has been proposed as a solution to many of these test problems. This panel will debate on what adaptive testing techniques can and can´t do as well as the interesting problems and research issues in this area. In a general sense, adaptive testing techniques include all approaches that modify the test configuration, condition, flow, stimuli, and constraints dynamically based on data collected during the test process. We will assume this general definition of adaptive testing and discuss the following questions in this panel: - What test problems can be uniquely solved by adaptive testing? - Is adaptive testing a topic for academia or is it really relevant for the industry? - How popular is adaptive testing in the industry now? Does it has any future? - What is needed to perform efficient adaptive testing and how hard is it to get it done? - What are the major challenges facing the deployment of adaptive testing? - What and how test data should be collected for adaptive testing? - When will the EDA companies start providing tools for adaptive testing? - What will be the hot research issues in adaptive testing? - Etc.