Efficient diagnosis technique for aging defects on automotive semiconductor chips

Author

Jihun Jung ; Ansari, Muhammad Adil ; Dooyoung Kim ; Hyunbean Yi ; Sungju Park

Author_Institution

Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea

fYear

2015

fDate

25-29 May 2015

Firstpage

1

Lastpage

2

Abstract

The semiconductor aging is one of the serious threats for the reliability of the system. This paper presents an efficient mechanism for predicting the aging effect. The captured data will be unloaded by shift operation, then verified through the aging monitoring operation. Especially the aging level of automotive semiconductor devices can be estimated by controlling the capture timing. Since the aging monitoring function is efficiently on and off during normal operation, power consumption can be reduced significantly compared with other approaches.

Keywords

ageing; automotive electronics; flip-flops; power consumption; semiconductor devices; aging effect prediction; aging monitoring operation; automotive semiconductor chips; automotive semiconductor device; capture timing; efficient diagnosis technique; power consumption; semiconductor aging defects; Aging; Clocks; Estimation; Flip-flops; Monitoring; Power demand; Timing; aging monitoring; on-line test; scan flip-flop;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ETS), 2015 20th IEEE European

Conference_Location

Cluj-Napoca

Type

conf

DOI

10.1109/ETS.2015.7138767

Filename

7138767