DocumentCode
7165
Title
Techniques for the Analysis and Elimination of Transient Oscillations in Wideband and Ultra-Wideband Pulsed Power Amplifiers
Author
Rodenbeck, Christopher T. ; Elsbury, Michael M. ; Dimsdle, Jeffrey W.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
61
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
3733
Lastpage
3742
Abstract
Wideband pulsed power amplifiers (PAs) often exhibit undesirable transient oscillations at the trailing edges of the pulsed radiofrequency (RF) output. To combat this problem, this paper introduces an approach for predicting and eliminating such transient oscillations in pulsed PAs. Root causes for the transient oscillations are identified and contrasted with other time-domain pulse-distortion phenomena. Effective analytical techniques are presented for predicting transient instability during the PA design process. These techniques are demonstrated using a series of monolithic GaAs HBT Class-A and Class-C ultra-wideband (UWB) pulsed PA RF integrated circuits (RFICs). RFIC variants designed to exhibit no transient oscillations successfully show no such effects; RFIC variants designed without considering transient stability as a design tradeoff do indeed generate pulsed transients with measured oscillation frequencies and damping ratio parameters in less than 2% error with predictions. These results should greatly facilitate the design of pulsed transmitters for wideband/UWB communications and radar applications.
Keywords
heterojunction bipolar transistors; power amplifiers; radiofrequency identification; GaAs; RF integrated circuits; monolithic HBT; pulsed radiofrequency output; transient oscillations; ultrawideband pulsed power amplifiers; Circuit stability; Modulation; Oscillators; Radio frequency; Stability analysis; Transient analysis; Wideband; Microwave stability analysis; pulse modulation; radiofrequency integrated circuit (RFIC) design; ultra-wideband (UWB) technology;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2013.2280114
Filename
6596515
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