DocumentCode
71785
Title
VTEAM: A General Model for Voltage-Controlled Memristors
Author
Kvatinsky, Shahar ; Ramadan, Misbah ; Friedman, Eby G. ; Kolodny, Avinoam
Author_Institution
Dept. of Comput. Sci., Stanford Univ., Stanford, CA, USA
Volume
62
Issue
8
fYear
2015
fDate
Aug. 2015
Firstpage
786
Lastpage
790
Abstract
Memristors are novel electrical devices used for a variety of applications, including memory, logic circuits, and neuromorphic systems. Memristive technologies are attractive due to their nonvolatility, scalability, and compatibility with CMOS. Numerous physical experiments have shown the existence of a threshold voltage in some physical memristors. Additionally, as shown in this brief, some applications require voltage-controlled memristors to operate properly. In this brief, a Voltage ThrEshold Adaptive Memristor (VTEAM) model is proposed to describe the behavior of voltage-controlled memristors. The VTEAM model extends the previously proposed ThrEshold Adaptive Memristor (TEAM) model, which describes current-controlled memristors. The VTEAM model has similar advantages as the TEAM model, i.e., it is simple, general, and flexible, and can characterize different voltage-controlled memristors. The VTEAM model is accurate (below 1.5% in terms of the relative root-mean-square error) and computationally efficient as compared with existing memristor models and experimental results describing different memristive technologies.
Keywords
active networks; electric current control; mean square error methods; memristor circuits; voltage control; VTEAM model; current-controlled memristors; root-mean-square error; voltage threshold adaptive memristor; voltage-controlled memristors; Data models; Integrated circuit modeling; Mathematical model; Memristors; Resistance; Switches; Threshold voltage; MATLAB; Memristive systems; ReRAM; SPICE; memristive systems; memristor; resistive random access memory (ReRAM); resistive switching;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2015.2433536
Filename
7110565
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