DocumentCode
71842
Title
Data-Dependent Operation Speed-Up Through Automatically Inserted Signal Transition Detectors for Ultralow Voltage Logic Circuits
Author
Botman, Francois ; Bol, David ; Legat, Jean-Didier ; Roy, Kaushik
Author_Institution
Univ. catholique de Louvain, Louvain-la-Neuve, Belgium
Volume
22
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
2561
Lastpage
2570
Abstract
With the advent of mobile electronics requiring ever more computing power from a limited energy supply, there is a need for efficient systems capable of maximizing this ratio. Architectural enhancements must therefore be designed to enable high performance, all the while maintaining the power advantage. The technique proposed in this paper allows the acceleration of combinatorial circuits beyond the performance generally achievable by conventional synthesis and timing closure, by exploiting the data-dependent delay variations inherent in such circuits. Through the automatic insertion of transition detectors within the target circuit, the progress of operations underway can be monitored and prematurely completed, thereby increasing the operation speed from the worst toward the average case. In addition, a synthesis flow is proposed to increase the proportion of fast paths, thereby increasing the technique´s impact. The proposed technique was applied automatically to a series of benchmark circuits, and the synthesis results show it to achieve good performance, with an average increase of 29% over conventional synthesis, for an average energy increase of ${<;}{21%}$ overall.
Keywords
combinational circuits; delay circuits; sensors; automatically inserted signal transition detector; benchmark circuit; combinatorial circuit; data-dependent delay variation; energy supply; mobile electronics; synthesis flow; ultralow voltage logic circuit; Clocks; Delays; Detectors; Registers; Synchronization; Transistors; Accelerator architectures; CMOS integrated circuits; low-power electronics; near-threshold/subthreshold logic; ultralow power; ultralow voltage; variability mitigation; variability mitigation.;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2013.2297176
Filename
6719479
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