DocumentCode
718452
Title
Modeling of stratified graphene-dielectric structures using the generalized boundary conditions: THz wave scattering by a thin sandwiched disk
Author
Balaban, Mikhail V.
Author_Institution
Lab. of Micro & Nano-Opt., Inst. for Radiophys. & Electron. NASU, Kharkiv, Ukraine
fYear
2015
fDate
21-24 April 2015
Firstpage
207
Lastpage
210
Abstract
We consider a modeling technique of stratified graphene-dielectric structures which is based on the effective two-side generalized boundary conditions (GBC). We obtain an effective GBC for graphene-dielectric, graphene-dielectric-graphene and dielectric-graphene-dielectric sandwiched-like layers and structures. Dielectric parameters and the graphene surface conductivity (determined from the Kubo formalism) are involved in electrical and magnetic resistivities of GBC as parameters. The scattering of the 3D electromagnetic field by a graphene-dielectric-graphene disk is studied numerically. We demonstrate the resonance behavior of radiated power for the on-axis horizontal magnetic dipole in the presence of such disk. It is shown that the resonance frequencies shift with variation of the chemical magnetic potential of the graphene.
Keywords
chemical potential; discs (structures); graphene; magnetoresistance; permittivity; sandwich structures; surface conductivity; terahertz wave spectra; 3D electromagnetic field scattering; C; Kubo formalism; THz wave scattering; chemical magnetic potential; dielectric permittivity; effective two-side generalized boundary conditions; electrical resistivity; magnetic resistivity; on-axis horizontal magnetic dipole; radiated power resonance; resonance frequencies; stratified graphene-dielectric structures; surface conductivity; thin sandwiched disk; Boundary conditions; Conductivity; Dielectrics; Electromagnetic scattering; Graphene; Magnetic resonance; generalized boundary conditions; graphene material; stratified structures; thin disk;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Nanotechnology (ELNANO), 2015 IEEE 35th International Conference on
Conference_Location
Kiev
Type
conf
DOI
10.1109/ELNANO.2015.7146873
Filename
7146873
Link To Document