• DocumentCode
    719191
  • Title

    An improvement on face recognition rate using local tetra patterns with support vector machine under varying illumination conditions

  • Author

    Juneja, Komal ; Verma, Akhilesh ; Goel, Swati

  • Author_Institution
    Dept. of CSE, AKGEC, Ghaziabad, India
  • fYear
    2015
  • fDate
    15-16 May 2015
  • Firstpage
    1079
  • Lastpage
    1084
  • Abstract
    Varying illumination condition make face recognition a challenging issue. In this paper, we propose a novel approach for solving this problem by performing three steps: (1) illumination normalization that normalizes the images using pre-processing chain of Gamma Correction, Difference of Gaussian and Contrast Equalization; (2) local tetra patterns (LTrPs) for texture based face representation; and (3) Support Vector Machine (SVM) for classification. The experimental results shows that face recognition rate of proposed system is improved from 97.9%, 97% and 99% to 99.34% as compared with LDP using Histogram Intersection, LBP using Chi-square, and LTP using Euclidean Distance respectively on Extended Yale-B database.
  • Keywords
    Gaussian processes; face recognition; image classification; image filtering; image representation; support vector machines; visual databases; Euclidean distance; LTrP; SVM; contrast equalization; difference-of-Gaussian; extended Yale-B database; face recognition rate improvement; gamma correction; illumination conditions; illumination normalization; image classification; image preprocessing; local tetra patterns; support vector machine; texture based face representation; Databases; Face; Face recognition; Feature extraction; Histograms; Lighting; Support vector machines; Classification; Face Recognition; Illumination; Local Binary Pattern (LBP); Local Derivative Pattern (LDP); Local Ternary Pattern (LTP); Local Tetra Pattern (LTrP); SVM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computing, Communication & Automation (ICCCA), 2015 International Conference on
  • Conference_Location
    Noida
  • Print_ISBN
    978-1-4799-8889-1
  • Type

    conf

  • DOI
    10.1109/CCAA.2015.7148566
  • Filename
    7148566