• DocumentCode
    719930
  • Title

    Stochastic color image segmentation using spatial constraints

  • Author

    Vasquez, Dionicio ; Scharcanski, Jacob ; Wong, Alexander

  • Author_Institution
    Inst. of Inf., Fed. Univ. of Rio Grande do Sul - UFRGS, Porto Alegre, Brazil
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    35
  • Lastpage
    40
  • Abstract
    This paper describes an automated method for segmenting color images based on a modified stochastic region merging strategy with multi-scale spatial constraints. First, a bilateral decomposition is performed, and an over-segmentation process is then performed based multichannel information and multi-scale gradients. Next, each sub-region is represented using a normalized color histogram in the CIE L*a*b* color space, and a region adjacency graph is constructed based on the over-segmentation results. Finally, a stochastic region merging strategy with spatial constraints is performed on the region adjacency graph to construct one segmentation map for each scale of representation. Our preliminary visual and quantitative experimental results on the Berkeley image database (BSDS500) are encouraging, and suggest that our proposed approach can provide accurate segmentation results.
  • Keywords
    graph theory; image colour analysis; image segmentation; stochastic processes; BSDS500; Berkeley image database; CIE L*a*b* color space; bilateral decomposition; multichannel information; multiscale gradients; multiscale spatial constraint; normalized color histogram; over-segmentation process; region adjacency graph; segmentation map; stochastic color image segmentation; stochastic region merging strategy; subregion representation; Color; Histograms; Image color analysis; Image edge detection; Image segmentation; Merging; Visualization; color image segmentation; image processing; object detection; stochastic region merging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151236
  • Filename
    7151236