DocumentCode
720074
Title
All-in-focus image reconstruction from in-line holograms of snowflakes
Author
Varjo, Sami ; Kaikkonen, Ville ; Hannuksela, Jari ; Makynen, Anssi
Author_Institution
Dept. of Comput. Sci. & Eng., Univ. of Oulu, Oulu, Finland
fYear
2015
fDate
11-14 May 2015
Firstpage
1096
Lastpage
1101
Abstract
In-line holography enables particle measurements in large imaging volumes with an extended depth of field compared with conventional imaging systems. Accurate measurements of the structural details of the particles are practically possible only if the measured details are brought in focus. In order to extract in-focus images of objects recorded into a digital hologram from a large set of holograms in a feasible manner, automated focusing and segmentation are needed. The twin image present inheritently in the in-line holography data leads to extra noise that makes this a challenging problem. We propose a new depth estimation method for in-line holography, where the stack of reconstructed intensity images is analyzed. First rough object locations are estimated where the object depths are estimated with a wavelet based focus measure. Clusters of depth estimates are used with plane fitting to approximate the object orientation in the 3D volume to obtain the final all-in-focus images. We show that the proposed method can be used to obtain sharp images of planar objects, such as snowflakes.
Keywords
holography; image reconstruction; image segmentation; optical focusing; 3D volume; all-in-focus image reconstruction; automated focusing; automated segmentation; depth estimation; digital hologram; in-line holograms; object orientation; particle measurements; plane fitting; reconstructed intensity images; recorded objects; rough object locations; snowflakes; twin image; wavelet based focus measure; Atmospheric measurements; Frequency measurement; Holography; Image reconstruction; Noise; Particle measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location
Pisa
Type
conf
DOI
10.1109/I2MTC.2015.7151424
Filename
7151424
Link To Document