• DocumentCode
    720074
  • Title

    All-in-focus image reconstruction from in-line holograms of snowflakes

  • Author

    Varjo, Sami ; Kaikkonen, Ville ; Hannuksela, Jari ; Makynen, Anssi

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of Oulu, Oulu, Finland
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    1096
  • Lastpage
    1101
  • Abstract
    In-line holography enables particle measurements in large imaging volumes with an extended depth of field compared with conventional imaging systems. Accurate measurements of the structural details of the particles are practically possible only if the measured details are brought in focus. In order to extract in-focus images of objects recorded into a digital hologram from a large set of holograms in a feasible manner, automated focusing and segmentation are needed. The twin image present inheritently in the in-line holography data leads to extra noise that makes this a challenging problem. We propose a new depth estimation method for in-line holography, where the stack of reconstructed intensity images is analyzed. First rough object locations are estimated where the object depths are estimated with a wavelet based focus measure. Clusters of depth estimates are used with plane fitting to approximate the object orientation in the 3D volume to obtain the final all-in-focus images. We show that the proposed method can be used to obtain sharp images of planar objects, such as snowflakes.
  • Keywords
    holography; image reconstruction; image segmentation; optical focusing; 3D volume; all-in-focus image reconstruction; automated focusing; automated segmentation; depth estimation; digital hologram; in-line holograms; object orientation; particle measurements; plane fitting; reconstructed intensity images; recorded objects; rough object locations; snowflakes; twin image; wavelet based focus measure; Atmospheric measurements; Frequency measurement; Holography; Image reconstruction; Noise; Particle measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151424
  • Filename
    7151424