Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms

Author

Renczes, B. ; Kollar, I. ; Carbone, P. ; Moschitta, A. ; Palfi, V. ; Virosztek, T.

Author_Institution

Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Budapest, Hungary

fYear

2015

fDate

11-14 May 2015

Firstpage

1662

Lastpage

1667

Abstract

In this paper the numerical behavior of different sine wave fitting methods is investigated. In addition to the Three- and Four-Parameter Least Squares Fits, also the Maximum Likelihood and the Quantile Based Estimator methods suffer from similar numerical problems that may disturb the result of the ADC test. Suggestions are given in order to improve the performance of the investigated algorithms.

Keywords

analogue-digital conversion; least squares approximations; maximum likelihood estimation; optimisation; finite resolution; four-parameter least squares fits; maximum likelihood method; numerical optimization problem; quantile based estimator method; sine wave fitting algorithms; three-parameter least squares fits; Digital signal processing; Fitting; Maximum likelihood estimation; Noise; Noise measurement; Quantization (signal); Roundoff errors; Analog-Digital Converter Testing; Least Squares Fit; Maximum Likelihood Method; Numerical Optimization; Quantile Based Estimator; Sine Wave Fitting;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International

Conference_Location

Pisa

Type

conf

DOI

10.1109/I2MTC.2015.7151529

Filename

7151529