• DocumentCode
    720201
  • Title

    An automatic thermal cycling based test platform for thermoelectric generator testing

  • Author

    De Cerqueira Veras, Julio Cezar ; Willian de Souza Arruda, Bruno ; Alburquerque Vieira, Debora ; Melo, Ewerton C. S. ; Protasio de Souza, Cleonilson

  • Author_Institution
    Coordination Sect. of Electron., Fed. Inst. of Pernambuco, Garanhuns, Brazil
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    1949
  • Lastpage
    1953
  • Abstract
    Thermoelectric (TE) modules are solid-state devices that convert directly thermal energy in electrical energy. However, they can undergo performance degradation due to thermal cycling. In the present study, a control-based test platform that is capable to apply specific thermal cycling pattern at periodic intervals is presented in order to evaluate performance degradation that influence the TE module lifetime. Using this test platform, some parameters and the figure of merit ZT of a commercial TE module are measured before and after thermal cycling application. An important feature of the proposed platform is that the applied thermal cycling is bipolar, that is, it is possible to apply positive or negative temperature difference and, through this, performance degradation would be observed after only 548 thermal cycles much lower than previous works.
  • Keywords
    modules; thermoelectric conversion; thermoelectric devices; TE module lifetime; automatic thermal cycling; control-based test platform; negative temperature difference; positive temperature difference; thermal cycling pattern; thermoelectric generator testing; thermoelectric modules; Conductivity; Degradation; Heating; Temperature measurement; Thermal degradation; Thermal resistance; Voltage measurement; Thermal cycling; experimental platform; performance degradation evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151580
  • Filename
    7151580