• DocumentCode
    720228
  • Title

    Simple interference detection and classification for industrial Wireless Sensor Networks

  • Author

    Sisinni, E. ; Caiola, S. ; Flammini, A. ; Gidlund, M. ; Barac, F.

  • Author_Institution
    DII - Dept. of Inf. Eng., Univ. of Brescia, Brescia, Italy
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    2106
  • Lastpage
    2110
  • Abstract
    Wireless Sensor Networks (WSNs) are increasingly deployed in office blocks, residential areas and also industrial locations, thanks to advantages in terms of flexibility and scalability. Nowadays available wireless fieldbuses are widely adopted for process monitoring and offer performance comparable with the wired counterparts, despite they still are more sensitive to interference from external sources. This work investigates the main sources of interference in the 2.4 GHz ISMband and evaluates the adoption of a simple algorithm to identify the interference. The proposed technique, called LPED, is based on bit error nature and forward error correction. The required computational effort is compatible with resources normally available in WSN nodes, as experimentally verified. In addition, performance in presence of IEEE802.11 and iWLAN is also verified; classification is correct in about 90% of cases.
  • Keywords
    forward error correction; radiofrequency interference; signal detection; wireless LAN; wireless sensor networks; IEEE802.11 network; ISM band; LPED technique; bit error nature; forward error correction; frequency 2.4 GHz; iWLAN; industrial WSN; interference classification; interference detection; lightweight packet error discriminator; wireless sensor networks; Classification algorithms; Decoding; Interference; Standards; Wireless LAN; Wireless communication; Wireless sensor networks; interference detection; smart devices; smart sensing; wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151608
  • Filename
    7151608