DocumentCode
720606
Title
Design and Analysis of Testable Mutual Exclusion Elements
Author
Yang Zhang ; Heck, Leandro S. ; Moreira, Matheus T. ; Zar, David ; Breuer, Mel ; Calazans, Ney L. V. ; Beerel, Peter A.
Author_Institution
Univ. of Southern California, Los Angeles, CA, USA
fYear
2015
fDate
4-6 May 2015
Firstpage
124
Lastpage
131
Abstract
Mutual exclusion elements (MUTEXes) are fundamental components of asynchronous arbiters and are particularly critical to ensure metastable signals are properly filtered before reaching the arbiter outputs. However, despite their importance, the testability of these circuits is typically limited to functional testing. This paper discusses why this is not sufficient and addresses testability issues in both full-custom and standard-cell implementations. In particular, it proposes two new testable implementations that not only ensure improved coverage for single stuck-at faults but also enable testing the filtering of metastable signals. Additionally, this article quantifies the cost of the testable designs by comparing them to similar traditional designs in terms of area, power and metastability resolution time. Results show the proposed optimizations do increase area and power but have small impact on performance.
Keywords
asynchronous circuits; circuit testing; network analysis; MUTEX; asynchronous arbiters; full-custom implementations; metastability resolution time; single stuck-at faults; standard-cell implementations; testable mutual exclusion elements; Circuit faults; Integrated circuit modeling; Inverters; Logic gates; Standards; Switches; Testing; MUTEX; Mutual exclusion element; arbiter; asynchronous circuits; metastability; tau; testability;
fLanguage
English
Publisher
ieee
Conference_Titel
Asynchronous Circuits and Systems (ASYNC), 2015 21st IEEE International Symposium on
Conference_Location
Mountain View, CA
ISSN
1522-8681
Type
conf
DOI
10.1109/ASYNC.2015.28
Filename
7152700
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