DocumentCode
720813
Title
Reciprocating surface grinding of semiconductor wafers: A kinematic model for grinding marks & pattern
Author
Qi Zhang ; Zhichao Li
Author_Institution
Sch. of Mech. Eng., Yangzhou Univ., Yangzhou, China
fYear
2015
fDate
15-16 March 2015
Firstpage
1
Lastpage
3
Abstract
Reciprocating surface grinding is one of state-of-the-art machining processes to flatten semiconductor wafers to obtain a better surface roughness and grinding marks uniformity. In this paper, a kinematic model is developed to study the grinding marks pattern resulted from the reciprocating surface grinding. The model is then utilized to simulate the grinding marks and compared with rotary surface grinding. Experiments are also conducted to verify the simulation results.
Keywords
grinding; machining; semiconductor technology; grinding mark pattern; kinematic model; machining process; reciprocating surface grinding; rotary surface grinding; semiconductor wafer; Clocks; Machining; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location
Shanghai
ISSN
2158-2297
Type
conf
DOI
10.1109/CSTIC.2015.7153418
Filename
7153418
Link To Document