• DocumentCode
    720813
  • Title

    Reciprocating surface grinding of semiconductor wafers: A kinematic model for grinding marks & pattern

  • Author

    Qi Zhang ; Zhichao Li

  • Author_Institution
    Sch. of Mech. Eng., Yangzhou Univ., Yangzhou, China
  • fYear
    2015
  • fDate
    15-16 March 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Reciprocating surface grinding is one of state-of-the-art machining processes to flatten semiconductor wafers to obtain a better surface roughness and grinding marks uniformity. In this paper, a kinematic model is developed to study the grinding marks pattern resulted from the reciprocating surface grinding. The model is then utilized to simulate the grinding marks and compared with rotary surface grinding. Experiments are also conducted to verify the simulation results.
  • Keywords
    grinding; machining; semiconductor technology; grinding mark pattern; kinematic model; machining process; reciprocating surface grinding; rotary surface grinding; semiconductor wafer; Clocks; Machining; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Technology International Conference (CSTIC), 2015 China
  • Conference_Location
    Shanghai
  • ISSN
    2158-2297
  • Type

    conf

  • DOI
    10.1109/CSTIC.2015.7153418
  • Filename
    7153418