• DocumentCode
    72099
  • Title

    Analyzing Transient Phenomena in the Time Domain Using the Feature Selective Validation (FSV) Method

  • Author

    Jauregui, Ricardo ; Gang Zhang ; Rojas-Mora, Julio ; Ventosa, Oriol ; Silva, Francisco ; Duffy, Alistair P. ; Sasse, Hugh

  • Author_Institution
    Dept. d´Eng. Electron., Univ. Politec. de Catalunya, Barcelona, Spain
  • Volume
    56
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    825
  • Lastpage
    834
  • Abstract
    The increasing application of simulation tools to increasingly complex problems makes the use of validation tools essential to improve confidence in the veracity of those simulation results. IEEE Standard 1597.1 is the first true standard for the validation of computational electromagnetics method. This standard uses the feature selective validation (FSV) method as the key quantification tool. However, despite its many advantages, there have been some interesting issues surrounding the validation of transients. This paper presents a new approach to the validation of a set of generally representative transient types using the FSV method and shows how the previously experienced limitations can be overcome. In order to analyze the main parameters associated with transient comparison, a survey which included 20 experts was conducted. This information was used to identify the significant regions that need to be taken into account in the transient comparison. Finally, using the statistics obtained by the experts, a new solution was defined and its improvement over the existing approach was demonstrated.
  • Keywords
    IEEE standards; computational electromagnetics; feature selection; statistical analysis; time-domain analysis; transient analysis; FSV method; IEEE Standard 1597.1; computational electromagnetics method; feature selective validation; statistics; time domain analysis; transient phenomena analysis; Computational modeling; Computer applications; Electromagnetic measurements; Feature extraction; Simuilation; Transient analysis; Computational electromagnetics method (CEM); computer simulation; data comparison; feature selective validation (FSV) method; numerical simulation; transient; validation;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2013.2246167
  • Filename
    6518138