DocumentCode
722345
Title
Film thickness induced magnetic anisotropy and ferromagnetic resonance in Fe56 Co24 B20 amorphous films prepared by pulse laser deposition
Author
Wu, C. ; Huang, Y. ; Cui, Y. ; Shen, Z. ; Ma, Y. ; Chen, C. ; Xie, S. ; Du, H. ; Li, Y. ; Li, S.
Author_Institution
Coll. of Phys. Sci., Qingdao Univ., Qingdao, China
fYear
2015
fDate
11-15 May 2015
Firstpage
1
Lastpage
1
Abstract
In this study, we propose a novel method to get higher uniaxial magnetic anisotropy (UMA), i .e . film thickness gradient induced UMA . The detailed sample preparation procedure can be described as follows: (100)-Si single crystal substrates with dimension of 25L×5W×0.5T mm3 are pasted on sample holder. A shutter is put between the target and shutter, and can be scanning back and forth along the length direction of the sample. Therefore, the film thickness with gradient distribution can be controlled by adjusting the scanning angular velocity of the shutter. A magnetic target with composition of Fe56Co24B20 was employed to verify the film thickness gradient induced UMA. The shutter angular velocity is 0 .01o/min. The elongated sample is divided into 5 equal-sized segments, and numbered the segments as n=1 to 5 respectively according to the film thickness from thicker to thinner.
Keywords
amorphous magnetic materials; boron alloys; cobalt alloys; ferromagnetic resonance; induced anisotropy (magnetic); iron alloys; magnetic thin films; metallic thin films; pulsed laser deposition; (100)-Si single crystal substrates; Fe56Co24B20; Si; amorphous films; ferromagnetic resonance; film thickness gradient induced uniaxial magnetic anisotropy; gradient distribution; length direction; preparation procedure; pulse laser deposition; shutter scanning angular velocity; size 0.5 mm; size 25 mm; size 5 mm; temperature 293 K to 298 K; Amorphous magnetic materials; Films; Magnetic resonance; Magnetoelectric effects; Perpendicular magnetic anisotropy; Saturation magnetization;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4799-7321-7
Type
conf
DOI
10.1109/INTMAG.2015.7157708
Filename
7157708
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