Non-destructive displaying defects for luminescence image of photovoltaic panel arrays

Author

Cheng-Yu Peng ; Shang-Yeh Wen ; Zhong-Jia Ji ; Chao-Ping Huang

Author_Institution

Green Energy & Environ. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan

fYear

2015

fDate

29-31 May 2015

Firstpage

1

Lastpage

4

Abstract

The non-destructive displaying defects of luminescence imaging is presented for inspecting silicon solar cell characterization of photovoltaic panel. The displaying system with photoluminescence can be applied to cleaning robotic device for tracing panel defects after cleaning photovoltaic panel arrays. A comparison method of the photoluminescence images with various illuminations has high sensitivity to reveal micro crack defect by image filter and threshold processes. It is simple to display the micro crack of commercial photovoltaic panel by non-contact inspection of photoluminescence.

Keywords

cleaning; microcracks; photoluminescence; solar cells; cleaning robotic device; illuminations; image filter; luminescence image; microcrack defect; noncontact inspection; nondestructive displaying defects; panel defects tracing; photoluminescence images; photovoltaic panel array cleaning; silicon solar cell; threshold processes; Cleaning; Luminescence; Photovoltaic systems; Robots; Sensitivity; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Robotics and Intelligent Systems (ARIS), 2015 International Conference on

Conference_Location

Taipei

Type

conf

DOI

10.1109/ARIS.2015.7158373

Filename

7158373