• DocumentCode
    723087
  • Title

    Temperature-aware power distribution network designs for 3D ICs and systems

  • Author

    Sung Joo Park ; Swaminathan, Madhavan

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    732
  • Lastpage
    737
  • Abstract
    Many recent problems related to integrated circuits have been solved by three-dimensional integration using throughsilicon vias. This technique presents some thermal-related issues related to high thermal density. In this work, we estimate the effects of temperature on power distribution networks consisting of a printed circuit board, an interposer, and stacked dies connected by through-silicon vias. The model we built has various on- and off-chip decoupling capacitors, so this paper analyzes the effects of temperature on power delivery network impedance and power ground noise using temperature-aware simulations. The results indicate that a high temperature density system requires both temperature-aware simulation and design. Based on further simulations with practical cases, this paper also presents an efficient power delivery network design method for three-dimensional systems consisting of various types of decoupling capacitors and heterogeneous dies.
  • Keywords
    capacitors; elemental semiconductors; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; printed circuit design; silicon; thermal analysis; three-dimensional integrated circuits; 3D IC; Si; heterogeneous dies; high temperature density system; integrated circuits; interposer; off-chip decoupling capacitors; on-chip decoupling capacitors; power delivery network design; power delivery network impedance; power ground noise; printed circuit board; stacked dies; temperature-aware power distribution network designs; temperature-aware simulations; thermal density; three-dimensional integration; three-dimensional systems; through silicon vias; Capacitance; Capacitors; Impedance; Resistance; System-on-chip; Temperature dependence; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159672
  • Filename
    7159672