• DocumentCode
    72485
  • Title

    Estimating Damping in Microresonators by Measuring Thermomechanical Noise Using Laser Doppler Vibrometry

  • Author

    Kuter-Arnebeck, Ottoleo ; Labuda, Aleksander ; Joshi, S. ; Das, Krishanu ; Vengallatore, Srikar

  • Author_Institution
    Dept. of Mech. Eng., McGill Univ., Montreal, QC, Canada
  • Volume
    23
  • Issue
    3
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    592
  • Lastpage
    599
  • Abstract
    The fluctuation-dissipation theorem establishes the fundamental links between thermomechanical noise and damping. In this paper, we bridge the gap between theory and practice by developing protocols for estimating dissipation in low-loss microresonators by measuring thermomechanical noise using laser Doppler vibrometry. The measurement does not require external actuation of the device and damping can be estimated without relying upon knowledge of material properties, device dimensions, or structural stiffness. The power spectral density of velocity and displacement noise is computed using a direct method that avoids segmenting the measurements in the time domain, thereby avoiding any bias in the estimation of the quality factor. We demonstrate the implementation of the protocol by measuring damping at room temperature and low pressure in four silicon-based microcantilever resonators with natural frequencies ranging from 17.6 to 26.7 kHz and quality factors ranging from 2×104 to 2×105 . The accuracy of noise-based estimates is evaluated by comparison with values of the log decrement measured under free decay.
  • Keywords
    Doppler measurement; Q-factor; cantilevers; damping; laser velocimetry; micromechanical resonators; noise measurement; damping estimation; device dimensions; displacement noise; dissipation estimation; fluctuation-dissipation theorem; frequency 17.6 kHz to 26.7 kHz; laser Doppler vibrometry; low-loss microresonators; material properties; noise-based estimates; power spectral density; protocols; quality factor estimation; silicon-based microcantilever resonators; structural stiffness; temperature 293 K to 298 K; thermomechanical noise measurement; time domain; velocity density; Damping; Frequency measurement; Noise; Noise measurement; Resonant frequency; Thermomechanical processes; Vibrations; MEMS; damping; laser Doppler vibrometry; laser Doppler vibrometry.; microresonators; thermomechanical noise;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2013.2286199
  • Filename
    6650014