• DocumentCode
    725482
  • Title

    Voltage stability analysis for the receiving-end grid of UHV-DC transmission system

  • Author

    Meng Liu ; Yiwei Zhang ; Yong Min ; Yanan Li ; Weiyong Jiang

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • fYear
    2015
  • fDate
    10-13 June 2015
  • Firstpage
    1240
  • Lastpage
    1244
  • Abstract
    Ultra high voltage direct current (UHV-DC) transmission system presents certain adverse reactive characteristics to its receiving-end grid. Voltage stability analysis for the landing point of UHV-DC transmission system is needed to find the available transmission capacity and its influence factors. First, this paper sets up test systems to discuss key influence factors, which are classified into grid limit and components limit. Secondly, with the real UHV-DC project of ±800kV HaZheng in China, a comprehensive analysis approach is presented to analyze the available transmission capacity of the landing point. The assessment procedure takes into account the normal, N-1 and N-2 operation conditions as well as the UHV-DC system operation variables, including commutation failure. Finally, the voltage stability assessment for the ±800kV HaZheng project is demonstrated. This presented method is simple and effective, which is usable for planning and operation of UHV-DC transmission system.
  • Keywords
    DC power transmission; commutation; power grids; power system stability; voltage regulators; China; HaZheng project; UHV-DC project; UHV-DC transmission system; commutation failure; receiving-end grid; transmission capacity; ultra high voltage direct current transmission system; voltage 800 kV; voltage stability analysis; voltage stability assessment; Circuit stability; Generators; Power system stability; Reactive power; Stability criteria; Thermal stability; UHV-DC; commutation failure; influence factors; transmission capacity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2015 IEEE 15th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4799-7992-9
  • Type

    conf

  • DOI
    10.1109/EEEIC.2015.7165346
  • Filename
    7165346