• DocumentCode
    725517
  • Title

    A novel electromagnetic transient modeling method of impact load of arc furnace

  • Author

    Liang Dong ; Zhiguo Hao ; Mingyu Huang ; Feng Gao ; Shuang Zhang

  • Author_Institution
    Sch. of Electr. Eng., Xi´an Jiaotong Univ., Xi´an, China
  • fYear
    2015
  • fDate
    10-13 June 2015
  • Firstpage
    1593
  • Lastpage
    1598
  • Abstract
    Access of electric arc furnace impact load has great influence on power system and electrical equipment. However, some models proposed cannot do transient simulation well because ignoring physical characteristics of arc, or some usually are complex to realize. All these problems are not conducive to study of EAF´s actual operation. Based on physical characteristics of arc and the law of energy conservation, a time-varying AC-arc resistance model which reflects physical nature of EAF is built by a novel non-linear differential equation in this paper. This model takes arc length and instantaneous current as inputs, and arc resistance as state variable. Then the novel model is built by some simple function modules in PSCAD/EMTDC. Finally, EAF simulation model is connected to power system as a load. Simulations have been done to research impact and harmonics influence of EAF on power system, and the superiority and validity of this modeling method is verified.
  • Keywords
    EMTP; arc furnaces; nonlinear differential equations; power system transients; EAF; PSCAD/EMTDC; electric arc furnace; electrical equipment; electromagnetic transient modeling method; impact load; nonlinear differential equation; power system; state variable; time-varying AC-arc resistance model; transient simulation; Electrodes; Furnaces; Harmonic analysis; Integrated circuit modeling; Load modeling; Mathematical model; Resistance; EAF; electrical arc furnace; energy conservation; function module; impact load; time-varying resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2015 IEEE 15th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4799-7992-9
  • Type

    conf

  • DOI
    10.1109/EEEIC.2015.7165409
  • Filename
    7165409