• DocumentCode
    726432
  • Title

    High-level synthesis of error detecting cores through low-cost modulo-3 shadow datapaths

  • Author

    Campbell, Keith A. ; Vissa, Pranay ; Pan, David Z. ; Deming Chen

  • Author_Institution
    Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this study, we propose a low-cost approach to error detection for arithmetic orientated data paths by performing lightweight shadow computations in modulo-3 space for each main computation. By leveraging the binding and scheduling flexibility of high-level synthesis, we detect errors through diverse binding and minimize area cost through intelligent checkpoint scheduling and modulo-3 reducer sharing. We evaluated our technique with 12 high-level synthesis benchmarks using FPGA emulated netlist-level error injection. We observe coverages of 99.13% for stuck-at faults, 99.46% for soft errors, and 99.67% for timing errors with a 25.7% area cost and negligible performance impact. Leveraging error detection latencies on the order of 10 cycles (3 orders of magnitude faster than end result check) for soft errors, we also explore a rollback recovery method with an additional area cost of 28.0%, observing a 175x increase in reliability against soft errors.
  • Keywords
    field programmable gate arrays; high level synthesis; scheduling; FPGA; checkpoint scheduling; error detection latency; field programmable gate array; high-level synthesis; low-cost modulo-3 shadow datapath; modulo-3 reducer sharing; netlist-level error injection; rollback recovery method; Benchmark testing; Hardware; Logic gates; Optimization; Registers; Reliability; Timing; High-level synthesis; aliasing; automation; binding; checkpointing; datapath; electrical faults; error detection; high performance; logic optimization; low cost; modulo arithmetic; optimization; pipelining; rollback recovery; scheduling; shadow logic; soft errors; state machine; stuck-at faults; timing errors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744851
  • Filename
    7167347