• DocumentCode
    728098
  • Title

    An improved constraint-tightening approach for Stochastic MPC

  • Author

    Lorenzen, Matthias ; Allgower, Frank ; Dabbene, Fabrizio ; Tempo, Roberto

  • Author_Institution
    Inst. for Syst. Theor. & Autom. Control, Univ. of Stuttgart, Stuttgart, Germany
  • fYear
    2015
  • fDate
    1-3 July 2015
  • Firstpage
    944
  • Lastpage
    949
  • Abstract
    The problem of achieving a good trade-off in Stochastic Model Predictive Control between the competing goals of improving the average performance and reducing conservativeness, while still guaranteeing recursive feasibility and low computational complexity, is addressed. We propose a novel, less restrictive scheme, which is based on considering stability and recursive feasibility separately. Through an explicit first step constraint we guarantee recursive feasibility. In particular we guarantee the existence of a feasible input trajectory at each time instant, but we only require that the input sequence computed at time k remains feasible at time k+1 for most disturbances, but not necessarily for all, which suffices for stability. To overcome the computational complexity of probabilistic constraints, we propose an offline constraint-tightening procedure, which can be efficiently solved to the desired accuracy via a sampling approach. The online computational complexity of the resulting Model Predictive Control (MPC) algorithm is similar to that of a nominal MPC with terminal region. A numerical example, which provides a comparison with classical, recursively feasible Stochastic MPC and Robust MPC, shows the efficacy of the proposed approach.
  • Keywords
    computational complexity; constraint handling; predictive control; probability; sampling methods; stability; stochastic systems; explicit first step constraint; offline constraint-tightening approach; online computational complexity; probabilistic constraints; recursive feasibility; sampling approach; stability; stochastic MPC; stochastic model predictive control; Electron tubes; Optimization; Probabilistic logic; Robustness; Standards; Stochastic processes; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2015
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4799-8685-9
  • Type

    conf

  • DOI
    10.1109/ACC.2015.7170855
  • Filename
    7170855