DocumentCode
728319
Title
Robust principal component analysis for iterative learning control of precision motion systems with non-repetitive disturbances
Author
Chung-Yen Lin ; Liting Sun ; Tomizuka, Masayoshi
Author_Institution
Dept. of Mech. Eng., Univ. of California, Berkeley, Berkeley, CA, USA
fYear
2015
fDate
1-3 July 2015
Firstpage
2819
Lastpage
2824
Abstract
In precision motion systems, the same desired trajectory may have to be repeatedly followed. In such cases, iterative learning control (ILC) is a useful strategy to improve the tracking performance at every iteration cycle. The fundamental assumption is that the error is due to repetitive disturbances. In practice, however, non-repetitive disturbances may also be present, and non-repetitive and repetitive disturbances may possess common frequency components. If non-repetitive disturbance effects enter the learning loop, the performance of ILC may be degraded. This paper studies the problem of robust ILC in the presence of non-repetitive disturbances. An optimization based time-domain Q-filtering technique is presented to prevent non-repetitive disturbances from entering the ILC learning loop. More precisely, we apply the robust principal component analysis (RPCA) to filter out non-repetitive effects from the error signals. The effectiveness of the proposed method is demonstrated on a laboratory setup to emulate precision motion control stages of a wafer scanner. The method is also applicable to a broad class of precision motion systems.
Keywords
filtering theory; iterative learning control; motion control; photolithography; principal component analysis; robust control; RPCA; common frequency components; error signals; iteration cycle; iterative learning control; nonrepetitive disturbance prevention; nonrepetitive effect filtering; optimization based time-domain Q-filtering technique; precision motion control; precision motion systems; repetitive disturbances; robust ILC learning loop; robust principal component analysis; tracking performance improvement; wafer scanner; Feedforward neural networks; Principal component analysis; Robustness; Sparse matrices; Standards; Time-domain analysis; Trajectory;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2015
Conference_Location
Chicago, IL
Print_ISBN
978-1-4799-8685-9
Type
conf
DOI
10.1109/ACC.2015.7171162
Filename
7171162
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