Title :
Temperature Droop Characteristics of Internal Efficiency in
Quantum Well Light-Emitting Diodes
Author :
Seoung-Hwan Park ; Yong-Tae Moon
Author_Institution :
Dept. of Electr. Eng., Catholic Univ. of Daegu, Kyungsan, South Korea
Abstract :
The temperature droop characteristics of internal efficiency (IE) in InGaN/GaN quantum well (QW) structures were investigated using the multiband effective mass theory. In the case of a relatively small Auger recombination (<; CA = 5 × 10-30 cm6s), the QW structure with a smaller In composition (x = 0.1) shows a larger hot/cold factor (IET1/IET2, with T1 > T2) than that with a larger In composition (x = 0.3) because the radiative recombination is dominant and the IE of the former is much larger than that of the latter. The hot/cold factors for QW structures with x = 0.1 and 0.3 are 0.85 and 0.71 at J = 100 A/cm2, respectively. On the other hand, in the case of a relatively large Auger recombination (> CA = 10-28 cm6s), the hot/cold factor (0.69) of the QW structure with a larger In composition is found to be larger than that (0.62) with a smaller In composition. This is attributed to the fact that the Auger recombination is dominant even for the QW structure with a small In composition and that the difference of the IE between two different temperatures decreases with increasing x.
Keywords :
Auger effect; III-V semiconductors; effective mass; gallium compounds; indium compounds; light emitting diodes; quantum well devices; semiconductor quantum wells; InGaN-GaN; hot-cold factor; internal efficiency; multiband effective mass theory; quantum well light emitting diodes; radiative recombination; small Auger recombination; temperature droop characteristics; Charge carrier density; Gallium nitride; Light emitting diodes; Radiative recombination; Stimulated emission; Temperature; GaN; InGaN; Temperature droop; light-emitting diode; quantum well;
Journal_Title :
Photonics Journal, IEEE
DOI :
10.1109/JPHOT.2014.2356504