• DocumentCode
    729083
  • Title

    Radiated emissions modelling from near-field data - toward international standards

  • Author

    Ramanujan, Abhishek ; Lafon, Frederic ; Fernandez-Lopez, Priscila

  • Author_Institution
    EMC Dept., Valeo GEEDS, Créteil, France
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    90
  • Lastpage
    93
  • Abstract
    As electromagnetic compatibility (EMC) gains ground in today´s world of electronics, integrated circuit (IC) and printed circuit board (PCB) modelling methods are of paramount importance during development of EMC compliant products. One such aspect focuses on modelling the emissions from ICs and PCBs, both conducted and radiated forms. This work proposes a method for modelling the radiated emissions of ICs (PCBs, ...) from near-field data. It also describes a universal exchange format for representing and sharing the model data between industrials, academics and EDA simulation tools.
  • Keywords
    electromagnetic compatibility; integrated circuit modelling; integrated circuit testing; printed circuit design; EDA simulation tools; EMC; IC radiated emissions; electromagnetic compatibility; integrated circuit; printed circuit board modelling methods; radiated emissions modelling; universal exchange format; Electromagnetic compatibility; Integrated circuit modeling; Magnetic analysis; Magnetic field measurement; Transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175293
  • Filename
    7175293