DocumentCode
729099
Title
A novel de-embedding method suitable for transmission-line measurement
Author
Bichen Chen ; Xiaoning Ye ; Samaras, Bill ; Jun Fan
Author_Institution
Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2015
fDate
26-29 May 2015
Firstpage
1
Lastpage
4
Abstract
A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.
Keywords
digital circuits; integrated circuit interconnections; integrated circuit testing; transmission lines; DUT; LRRM; SOLT; TRL; calibration approaches; device under testing; line-reflect-reflect-match; measurement patterns; quasisymmetry requirement; short-open-load-through; test fixture; thru-reflect-line; transmission-line measurement; two-pattern deembedding methodologies; Calibration; Fixtures; Frequency measurement; Impedance; Power transmission lines; Scattering parameters; Transmission line measurements; Transmission line; de-embedding; line-reflect-match (LRM); line-reflect-reflect-match (LRRM); mixed mode scattering parameters; scattering parameters measurement; short-open-load-through (SOLT); thru-reflect-line (TRL);
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4799-6668-4
Type
conf
DOI
10.1109/APEMC.2015.7175313
Filename
7175313
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