• DocumentCode
    729099
  • Title

    A novel de-embedding method suitable for transmission-line measurement

  • Author

    Bichen Chen ; Xiaoning Ye ; Samaras, Bill ; Jun Fan

  • Author_Institution
    Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.
  • Keywords
    digital circuits; integrated circuit interconnections; integrated circuit testing; transmission lines; DUT; LRRM; SOLT; TRL; calibration approaches; device under testing; line-reflect-reflect-match; measurement patterns; quasisymmetry requirement; short-open-load-through; test fixture; thru-reflect-line; transmission-line measurement; two-pattern deembedding methodologies; Calibration; Fixtures; Frequency measurement; Impedance; Power transmission lines; Scattering parameters; Transmission line measurements; Transmission line; de-embedding; line-reflect-match (LRM); line-reflect-reflect-match (LRRM); mixed mode scattering parameters; scattering parameters measurement; short-open-load-through (SOLT); thru-reflect-line (TRL);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175313
  • Filename
    7175313